ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Mehr…
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ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Mehr…
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ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below. It sets out state-of-the-art variation… Mehr…
| hive.co.uk No. 9781461422693. Versandkosten:Instock, Despatched same working day before 3pm, zzgl. Versandkosten. Details... |
ISBN: 9781461422693
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide: ab 96.49 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH, Springer-Verlag GmbH
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2012, ISBN: 9781461422693
eBooks, eBook Download (PDF), 2012, [PU: Springer New York], Springer New York, 2012
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ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Mehr…
ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Mehr…
ISBN: 9781461422693
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below. It sets out state-of-the-art variation… Mehr…
ISBN: 9781461422693
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide: ab 96.49 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH, Springer-Verlag GmbH
2012, ISBN: 9781461422693
eBooks, eBook Download (PDF), 2012, [PU: Springer New York], Springer New York, 2012
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Detailangaben zum Buch - Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
EAN (ISBN-13): 9781461422693
ISBN (ISBN-10): 1461422698
Erscheinungsjahr: 2012
Herausgeber: Springer New York
188 Seiten
Sprache: eng/Englisch
Buch in der Datenbank seit 2012-05-26T05:47:47+02:00 (Berlin)
Detailseite zuletzt geändert am 2024-03-13T09:26:26+01:00 (Berlin)
ISBN/EAN: 9781461422693
ISBN - alternative Schreibweisen:
1-4614-2269-8, 978-1-4614-2269-3
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: dyck, kristopher, amit, kristo, gupta gupta, moorhead, rinehart, mcconaghy
Titel des Buches: field guide, hand, few hands, variation, integrated circuits
Daten vom Verlag:
Autor/in: Trent McConaghy; Kristopher Breen; Jeffrey Dyck; Amit Gupta
Titel: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
Verlag: Springer; Springer US
188 Seiten
Erscheinungsjahr: 2012-10-02
New York; NY; US
Gedruckt / Hergestellt in Großbritannien.
Sprache: Englisch
96,29 € (DE)
99,00 € (AT)
106,50 CHF (CH)
Available
XVI, 188 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Custom Integrated Circuits; Integrated Circuits; Resilient VLSI Circuits; Statistical process variations; Variation-Aware CAD; Variation-Aware Integrated Circuit Design; Variation-Tolerant Integrated Circuit Design; B; Circuits and Systems; Electronics and Microelectronics, Instrumentation; Nanotechnology and Microengineering; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Microsystems and MEMS; Engineering; Elektronik; BB
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions. Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows.Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable.Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation.Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification.Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications.Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3σ statistical and high-sigma statistical design.Weitere, andere Bücher, die diesem Buch sehr ähnlich sein könnten:
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