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Advanced Test Methods for SRAMs - Alberto Bosio
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Advanced Test Methods for SRAMs - neues Buch

1, ISBN: 9781441909374

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book., DE, [SC: 30.00], Neuware, gewerbliches Angebot, 241x165x23 mm, 171, [GW: 431g], offene Rechnung (Vorkasse vorbehalten), sofortueberweisung.de, Selbstabholung und Barzahlung, Skrill/Moneybookers, PayPal, Lastschrift, Banküberweisung, Internationaler Versand

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Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Alberto Bosio
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Alberto Bosio:
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - neues Buch

2009, ISBN: 1441909370

ID: 9730369334

[EAN: 9781441909374], Neubuch, [SC: 10.32], [PU: Springer-Verlag Gmbh Nov 2009], ELEKTRONIK / HALBLEITER; LEITUNG (PHYSIKALISCH) HALBLEITER, Neuware - Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book. 171 pp. Englisch

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Advanced Test Methods for SRAMs - Alberto Bosio
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Alberto Bosio:
Advanced Test Methods for SRAMs - neues Buch

1, ISBN: 9781441909374

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book., DE, [SC: 30.00], Neuware, gewerbliches Angebot, 241x165x23 mm, 171, [GW: 431g], PayPal, Banküberweisung, Internationaler Versand

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Advanced Test Methods for SRAMs - Alberto Bosio
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(*)
Alberto Bosio:
Advanced Test Methods for SRAMs - neues Buch

ISBN: 9781441909374

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book., DE, [SC: 0.00], Neuware, gewerbliches Angebot, 235x155x23 mm, 171, [GW: 431g], Banküberweisung, PayPal

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Advanced Test Methods for SRAMs - Bosio, Alberto; Dilillo, Luigi; Pravossoudovitch, Serge; Virazel, Arnaud; Girard, Patrick
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Bosio, Alberto; Dilillo, Luigi; Pravossoudovitch, Serge; Virazel, Arnaud; Girard, Patrick:
Advanced Test Methods for SRAMs - neues Buch

ISBN: 9781441909374

ID: 511613

Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Technology Technology eBook, Springer US

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Details zum Buch
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book. TOC:Introduction.-Basics on SRAM Memory Testing.-Resistive-Open Defects in Core-Cells.-Open Defects in Pre-Charge Circuits.-Resistive-Open Defects in Address Decoders.-Resistive-Open Defects in Write Drivers.-Resistive-Open Defects in Sense Amplifiers.-Faults due to Process Variations in SRAMs.-Diagnosis of Dynamic Faults.-Conclusion.

Detailangaben zum Buch - Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies


EAN (ISBN-13): 9781441909374
ISBN (ISBN-10): 1441909370
Gebundene Ausgabe
Erscheinungsjahr: 2009
Herausgeber: Springer-Verlag GmbH
171 Seiten
Gewicht: 0,431 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 16.07.2007 19:12:18
Buch zuletzt gefunden am 17.02.2018 12:37:01
ISBN/EAN: 9781441909374

ISBN - alternative Schreibweisen:
1-4419-0937-0, 978-1-4419-0937-4


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