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Microelectronic Reliability: Integrity Assessment and Assurance - Emiliano Pollino
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Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library) - Pollino, Emiliano
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Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library) - Pollino, Emiliano
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Details zum Buch
Microelectronic Reliability: Integrity Assessment and Assurance
Autor:

Pollino, Emiliano

Titel:

Microelectronic Reliability: Integrity Assessment and Assurance

ISBN-Nummer:

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

Detailangaben zum Buch - Microelectronic Reliability: Integrity Assessment and Assurance


EAN (ISBN-13): 9780890063507
ISBN (ISBN-10): 0890063508
Gebundene Ausgabe
Erscheinungsjahr: 1989
Herausgeber: ARTECH HOUSE INC
556 Seiten
Gewicht: 1,089 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 28.07.2007 05:00:15
Buch zuletzt gefunden am 03.04.2017 18:09:55
ISBN/EAN: 9780890063507

ISBN - alternative Schreibweisen:
0-89006-350-8, 978-0-89006-350-7


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