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Advanced Test Methods for Srams - Bosio, Alberto; Dilillo, Luigi; Girard, Patrick
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Bosio, Alberto; Dilillo, Luigi; Girard, Patrick:
Advanced Test Methods for Srams - Taschenbuch

2009, ISBN: 1441909397, Lieferbar binnen 4-6 Wochen Versandkosten:Versandkostenfrei innerhalb der BRD

ID: 9781441909398

Internationaler Buchtitel. In englischer Sprache. Verlag: SPRINGER VERLAG GMBH, 188 Seiten, L=156mm, B=234mm, H=10mm, Gew.=272gr, [GR: 26830 - TB/Maschinenbau/Fertigungstechnik], [SW: - Technology & Industrial Arts], Kartoniert/Broschiert, Klappentext: Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults," are not covered by classical test solutions and require the dedicated test sequences presented in this book. Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults," are not covered by classical test solutions and require the dedicated test sequences presented in this book.

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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults," are not covered by classical test solutions and require the dedicated test sequences presented in this book.

Detailangaben zum Buch - Advanced Test Methods for Srams


EAN (ISBN-13): 9781441909398
ISBN (ISBN-10): 1441909397
Taschenbuch
Erscheinungsjahr: 2009
Herausgeber: SPRINGER VERLAG GMBH
188 Seiten
Gewicht: 0,272 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 22.06.2011 08:14:59
Buch zuletzt gefunden am 22.06.2011 08:14:59
ISBN/EAN: 1441909397

ISBN - alternative Schreibweisen:
1-4419-0939-7, 978-1-4419-0939-8


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