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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg
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Rajesh Garg:
Analysis and Design of Resilient VLSI Circuits - gebunden oder broschiert

ISBN: 9781441909305

ID: 9781441909305

Mitigating Soft Errors and Process Variations This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. Analysis and Design of Resilient VLSI Circuits: This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. CAD - Computer Aided Design Computer Aided Design ( CAD ), Springer-Verlag Gmbh

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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg#Sunil P. Khatri
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Analysis and Design of Resilient VLSI Circuits - neues Buch

ISBN: 9781441909305

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VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, presenting algorithms and techniques to analyze and mitigate design problems. This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. Bücher / Fremdsprachige Bücher / Englische Bücher 978-1-4419-0930-5, Springer

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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg#Sunil P. Khatri
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Rajesh Garg#Sunil P. Khatri:
Analysis and Design of Resilient VLSI Circuits - neues Buch

ISBN: 9781441909305

ID: 683266889

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, presenting algorithms and techniques to analyze and mitigate design problems. Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Rajesh Garg:
Analysis and Design of Resilient VLSI Circuits - neues Buch

ISBN: 9781441909305

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant., DE, [SC: 0.00], Neuware, gewerbliches Angebot, 241x155x23 mm, 212, [GW: 501g], Banküberweisung, PayPal

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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Rajesh Garg:
Analysis and Design of Resilient VLSI Circuits - neues Buch

ISBN: 9781441909305

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant., Neuware, gewerbliches Angebot, 241x155x23 mm, [GW: 501g]

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Details zum Buch
Analysis and Design of Resilient VLSI Circuits
Autor:

Garg, Rajesh; Khatri, Sunil P.

Titel:

Analysis and Design of Resilient VLSI Circuits

ISBN-Nummer:

This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems.

Detailangaben zum Buch - Analysis and Design of Resilient VLSI Circuits


EAN (ISBN-13): 9781441909305
ISBN (ISBN-10): 1441909303
Gebundene Ausgabe
Erscheinungsjahr: 2009
Herausgeber: Springer-Verlag GmbH
212 Seiten
Gewicht: 0,501 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 07.12.2009 21:28:53
Buch zuletzt gefunden am 08.06.2017 14:41:43
ISBN/EAN: 1441909303

ISBN - alternative Schreibweisen:
1-4419-0930-3, 978-1-4419-0930-5


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