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Power-Aware Testing and Test Strategies for Low Power Devices
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Power-Aware Testing and Test Strategies for Low Power Devices - Taschenbuch

2010, ISBN: 144190929X, Lieferbar binnen 4-6 Wochen Versandkosten:Versandkostenfrei innerhalb der BRD

ID: 9781441909299

Internationaler Buchtitel. In englischer Sprache. Verlag: SPRINGER VERLAG GMBH, 388 Seiten, L=156mm, B=234mm, H=20mm, Gew.=540gr, [GR: 26830 - TB/Maschinenbau/Fertigungstechnik], [SW: - Technology & Industrial Arts], Kartoniert/Broschiert, Klappentext: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

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Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Detailangaben zum Buch - Power-Aware Testing and Test Strategies for Low Power Devices


EAN (ISBN-13): 9781441909299
ISBN (ISBN-10): 144190929X
Taschenbuch
Erscheinungsjahr: 2010
Herausgeber: SPRINGER VERLAG GMBH
388 Seiten
Gewicht: 0,540 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 04.01.2011 09:06:17
Buch zuletzt gefunden am 04.01.2011 09:06:17
ISBN/EAN: 144190929X

ISBN - alternative Schreibweisen:
1-4419-0929-X, 978-1-4419-0929-9


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