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Electrical Characterization of Silicon-On-Insulator Materials and Devices by Sorin Cristoloveanu Hardcover | Indigo Chapters
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Electrical Characterization of Silicon-On-Insulator Materials and Devices by Sorin Cristoloveanu Hardcover | Indigo Chapters - neues Buch

ISBN: 9780792395485

Silicon on Insulator is more than a technology, more than a job, and more than a venture in microelectronics; it is something different and refreshing in device physics. This book recalls… Mehr…

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Sorin Cristoloveanu, Sheng Li:

Electrical Characterization of Silicon-on-Insulator Materials and Devices (Hardback) - gebunden oder broschiert

1995, ISBN: 0792395484

[EAN: 9780792395485], Neubuch, [PU: Springer, Netherlands], Language: English. Brand new Book. Silicon on Insulator is more than a technology, more than a job, and more than a venture in … Mehr…

NEW BOOK. Versandkosten: EUR 0.59 The Book Depository, London, United Kingdom [54837791] [Rating: 5 (von 5)]
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Sorin Cristoloveanu, Sheng Li:
Electrical Characterization of Silicon-on-Insulator Materials and Devices (Hardback) - gebunden oder broschiert

1995

ISBN: 0792395484

[EAN: 9780792395485], Neubuch, [PU: Springer, Netherlands], Language: English. Brand new Book. Silicon on Insulator is more than a technology, more than a job, and more than a venture in … Mehr…

NEW BOOK. Versandkosten: EUR 7.10 Book Depository hard to find, London, United Kingdom [63688905] [Rating: 5 (von 5)]
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Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305) - Cristoloveanu, Sorin, Li, Sheng
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Cristoloveanu, Sorin, Li, Sheng:
Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305) - gebunden oder broschiert

1995, ISBN: 9780792395485

Springer, Gebundene Ausgabe, Auflage: 1995, 396 Seiten, Publiziert: 1995-06-30T00:00:01Z, Produktgruppe: Buch, 3.57 kg, Verkaufsrang: 8131, Hardware & Technik, Computer & Internet, Katego… Mehr…

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Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305) - Cristoloveanu, Sorin, Li, Sheng
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Cristoloveanu, Sorin, Li, Sheng:
Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305) - gebunden oder broschiert

1995, ISBN: 9780792395485

Springer, Gebundene Ausgabe, Auflage: 1995, 396 Seiten, Publiziert: 1995-06-30T00:00:01Z, Produktgruppe: Buch, 3.57 kg, Verkaufsrang: 8131, Hardware & Technik, Computer & Internet, Katego… Mehr…

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Bibliographische Daten des bestpassenden Buches

Details zum Buch
Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305)

Electrical Characterization of Silicon-on-Insulator Materials and Devices describes a wide variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. Each technique comes with pertinent technical information -- experimental set-up, basic models, parameter extraction -- that can be immediately useful to the reader. Electrical Characterization of Silicon-on-Insulator Materials and Devices provides a comprehensive and accessible treatment of all aspects of the latest SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues. Both the academic researchers and engineers working on the SOI technology will find this book invaluable as a source of pertinent scientific information, practical details, and references. For people planning to enter the SOI field, this book offers a unique coverage of the SOI technology and an attractive presentation of the underlying concepts. This book may also be used as a graduate level textbook for students who wish to learn more about the physics, applications, and electrical characterization of SOI devices.

Detailangaben zum Buch - Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305)


EAN (ISBN-13): 9780792395485
ISBN (ISBN-10): 0792395484
Gebundene Ausgabe
Erscheinungsjahr: 1995
Herausgeber: Springer
400 Seiten
Gewicht: 0,760 kg

Buch in der Datenbank seit 2007-11-18T04:22:02+01:00 (Berlin)
Detailseite zuletzt geändert am 2022-12-01T15:52:17+01:00 (Berlin)
ISBN/EAN: 0792395484

ISBN - alternative Schreibweisen:
0-7923-9548-4, 978-0-7923-9548-5
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: sorin, sheng
Titel des Buches: silicon, the science and engineering materials, electrical materials, devices wonder, electrical engineering material, characterization materials


Daten vom Verlag:

Autor/in: Sorin Cristoloveanu; Sheng Li
Titel: The Springer International Series in Engineering and Computer Science; Electrical Characterization of Silicon-on-Insulator Materials and Devices
Verlag: Springer; Springer US
381 Seiten
Erscheinungsjahr: 1995-06-30
New York; NY; US
Sprache: Englisch
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
Available
XV, 381 p.

BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Elektrotechnik; Verstehen; Diode; electronics; material; microelectronics; transistor; Wafer; Electrical and Electronic Engineering; Optical Materials; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; EA; BC

Preface.- 1 Introduction.- 1.1 Why SOI ?.- 1.2 Why Not Yet SOI ?.- 1.3 Why an SOI Book?.- 2 Methods of Forming SOI Wafers.- 2.1 SIMOX.- 2.2 Wafer Bonding.- 2.3 Zone-Melting Recrystallization.- 2.4 Epitaxial Lateral Overgrowth.- 2.5 Full Isolation by Porous Oxidized Silicon.- 2.6 Silicon on Sapphire.- 2.7 Silicon on Zirconia.- 3 SOI Devices.- 3.1 Advanced CMOS and Bipolar Devices.- 3.2 Radiation-Hardened Circuits.- 3.3 High-Voltage Devices.- 3.4 High-Temperature Devices.- 3.5 Low-Power Applications.- 3.6 Three-Dimensional Devices.- 3.7 Transducers.- 3.8 Innovative Devices.- 4 Wafer-Screening Techniques.- 4.1 The Basis for Wafer Screening.- 4.2 Surface Photovoltage.- 4.3 Dual-Beam S-Polarized Reflectance.- 4.4 Dual-Beam Optical Modulation.- 4.5 Other Optical Methods.- 4.6 Point Contact Pseudo-MOS Transistor.- 4.7 Quick-Turnaround Capacitance.- 4.8 Pinhole Detection.- 4.9 Conclusion.- 5 Transport Measurements.- 5.1 Four-Point Probe.- 5.2 Spreading Resistance.- 5.3 Hall Effect and Magnetoresistance.- 5.4 Van der Pauw Measurements.- 5.5 Photoconductivity.- 5.6 PICTS.- 6 SIS Capacitor-Based Characterization Techniques.- 6.1 Capacitance and Conductance Techniques.- 6.2 Bias-Scan DLTS Technique.- 6.4 Zerbst Method and Generation Lifetime.- 6.5 MOS Capacitance Method.- 7 Diode Measurements.- 7.1 Current—Voltage Measurements in a P—N Diode.- 7.2 Differential Current/Capacitance Method.- 7.3 Gated-Diode Measurements.- 7.4 Deep-Level Transient Spectroscopy.- 8 Electrical Characterization of SOI Materials and Devices MOS Transistor Characteristics.- 9 Transistor-Based Characterization Techniques.- List of Symbols.

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