ISBN: 9783540373193
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial a… Mehr…
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2006, ISBN: 9783540373193
The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every … Mehr…
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ISBN: 9783540373193
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ISBN: 9783540373193
Applied Scanning Probe Methods VI - Characterization: ab 106.99 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH eBook als pdf, Springer-Verlag GmbH
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2006, ISBN: 9783540373193
Characterization, eBooks, eBook Download (PDF), 2007, [PU: Springer Berlin], Springer Berlin, 2006
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ISBN: 9783540373193
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial a… Mehr…
2006, ISBN: 9783540373193
The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every … Mehr…
ISBN: 9783540373193
; PDF; Scientific, Technical and Medical > Science: general issues > Scientific equipment, experiments & te, Springer Berlin Heidelberg
ISBN: 9783540373193
Applied Scanning Probe Methods VI - Characterization: ab 106.99 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH eBook als pdf, Springer-Verlag GmbH
2006, ISBN: 9783540373193
Characterization, eBooks, eBook Download (PDF), 2007, [PU: Springer Berlin], Springer Berlin, 2006
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Detailangaben zum Buch - Applied Scanning Probe Methods VI
EAN (ISBN-13): 9783540373193
Erscheinungsjahr: 2006
Herausgeber: Springer Berlin
338 Seiten
Sprache: eng/Englisch
Buch in der Datenbank seit 2009-10-17T14:40:10+02:00 (Berlin)
Detailseite zuletzt geändert am 2024-01-14T12:42:07+01:00 (Berlin)
ISBN/EAN: 9783540373193
ISBN - alternative Schreibweisen:
978-3-540-37319-3
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: bhushan, timmermann
Titel des Buches: applied scanning probe methods
Daten vom Verlag:
Autor/in: Bharat Bhushan; Satoshi Kawata
Titel: NanoScience and Technology; Applied Scanning Probe Methods VI - Characterization
Verlag: Springer; Springer Berlin
338 Seiten
Erscheinungsjahr: 2006-11-07
Berlin; Heidelberg; DE
Sprache: Englisch
106,99 € (DE)
110,00 € (AT)
130,00 CHF (CH)
Available
XLV, 338 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Allgemeines, Lexika; Elektronik; Verstehen; AFM; Material Science; Microscopy; Nanoscience; Nanotube; Physical Chemistry; Polymer; STM; Surface Science; ceramics; liquid; spectroscopy; C; Microsystems and MEMS; Nanotechnology; Surfaces, Interfaces and Thin Film; Polymers; Physical Chemistry; Condensed Matter Physics; Chemistry and Materials Science; Nanotechnologie; Materialwissenschaft; Technische Anwendung von Polymeren und Verbundwerkstoffen; Physikalische Chemie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BB
Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices.- Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules.- STM Studies on Molecular Assembly at Solid/Liquid Interfaces.- Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope.- Atomic Force Microscopy of DNA Structure and Interactions.- Direct Detection of Ligand-Protein Interaction Using AFM.- Dynamic Force Microscopy for Molecular-Scale Investigations of Organic Materials in Various Environments.- Noncontact Atomic Force Microscopy.- Tip-Enhanced Spectroscopy for Nano Investigation of Molecular Vibrations.- Investigating Individual Carbon Nanotube/Polymer Interfaces with Scanning Probe Microscopy.First book summarizing the state-of-the-art of this technique Real industrial applications included Includes supplementary material: sn.pub/extras
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