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Interferogram Analysis For Optical Testing, Second Edition - Malacara, Zacarias; Servn, Manuel
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ISBN: 9781574446821

ID: 263703

(condensed). Review and Comparison of the Main Interferometric Systems: Two-Wave Interferometers and Configurations Used in Optical Testing. Twyman-Green Interferometer. Fizeau Interferometers. Typical Interferograms in Twyman-Green and Fizeau Interferometers. Lateral Shear Interferometers. Ronchi Test. Hartmann Test. Fringe Projection. Talbot Interferometry and Moir Deflectometry. Common Light Sources Used in Interferometry. Aspherical Compensators and Aspheric Wavefronts. Imaging of the Pupil on the Observation Plane. Multiple-Wavelength Interferometry. Fourier Theory Review: Introduction. Fourier Series. Fourier Transforms. The Convolution of Two Functions. The Cross-Correlation of Two Functions. Sampling Theorem. Sampling of a Periodical Function. Sampling of a Periodical Function with Interval Averaging. Fast Fourier Transform. Digital Image Processing: Introduction. Histogram and Gray-Scale Transformations. Space and Frequency Domain of Interferograms. Digital Processing of Images. Some Useful Spatial Filters. Square Window Filter. Hamming and Hanning Window Filters. Cosinusoidal and Sinusoidal Window Filters. Extrapolation of Fringes Outside of the Pupil. Light Detectors Used To Digitize Images. Fringe Contouring and Polynomial Fitting: Fringe Detection Using Manual Digitizers. Fringe Tracking and Fringe Skeletonizing. Global Polynomial Interpolation. Local Interpolation by Segments. Wavefront Representation by an Array of Gaussians.References. Periodic Signal Phase Detection and Algorithms Analysis: Least Squares Phase Detection of a Sinusoidal Signal. Quadrature Phase Detection of a Sinusoidal Signal. Discrete Low-Pass Filtering Functions. Fourier Description of Synchronous Phase Detection. Synchronous Detection Using a Few Sampling Points. Signal Amplitude Measurement. Characteristic Polynomial of a Sampling Algorithm. General Error Analysis of Synchronous Phase-Detection Algorithms. Some Sources of Phase Error. Shifting Algorithms with Respect to the Phase Origin. Optimization of Phase-Detection Algorithms. Influence of Window Function of Sampling Algorithms. Conclusions. Appendix: Derivative of the Amplitude of the Fourier Transform of the Reference Sampling Functions. References. Phase-Detection Algorithms: General Properties of Synchronous Phase-Detection Algorithms. Three-Step Algorithms To Measure the Phase. Four-Step Algorithms To Measure the Phase. Five-Step Algorithm. Algorithms with Symmetrical N +1 Phase Steps. Combined Algorithms in Quadrature. Detuning-Insensitive Algorithms for Distorted Signals. Algorithms Corrected for Nonlinear Phase-Shifting Error. Continuous Sampling in a Finite Interval. Asynchronous Phase-Detection Algorithms. Algorithm Summary. References. Phase-Shifting Interferometry: Phase-Shifting Basic Principles. An Introduction to Phase Shifting. Phase-Shifting Schemes and Phase Measurement. Heterodyne Interferometry. Phase-lock Detection. Sinusoidal Phase Oscillation Detection. Practical Source Technology Technology eBook, CRC Press

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Interferogram Analysis For Optical Testing, Second Edition - Malacara, Zacarias; Servn, Manuel
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Malacara, Zacarias; Servn, Manuel:

Interferogram Analysis For Optical Testing, Second Edition - neues Buch

ISBN: 9781574446821

ID: 263703

(condensed). Review and Comparison of the Main Interferometric Systems: Two-Wave Interferometers and Configurations Used in Optical Testing. Twyman-Green Interferometer. Fizeau Interferometers. Typical Interferograms in Twyman-Green and Fizeau Interferometers. Lateral Shear Interferometers. Ronchi Test. Hartmann Test. Fringe Projection. Talbot Interferometry and Moir Deflectometry. Common Light Sources Used in Interferometry. Aspherical Compensators and Aspheric Wavefronts. Imaging of the Pupil on the Observation Plane. Multiple-Wavelength Interferometry. Fourier Theory Review: Introduction. Fourier Series. Fourier Transforms. The Convolution of Two Functions. The Cross-Correlation of Two Functions. Sampling Theorem. Sampling of a Periodical Function. Sampling of a Periodical Function with Interval Averaging. Fast Fourier Transform. Digital Image Processing: Introduction. Histogram and Gray-Scale Transformations. Space and Frequency Domain of Interferograms. Digital Processing of Images. Some Useful Spatial Filters. Square Window Filter. Hamming and Hanning Window Filters. Cosinusoidal and Sinusoidal Window Filters. Extrapolation of Fringes Outside of the Pupil. Light Detectors Used To Digitize Images. Fringe Contouring and Polynomial Fitting: Fringe Detection Using Manual Digitizers. Fringe Tracking and Fringe Skeletonizing. Global Polynomial Interpolation. Local Interpolation by Segments. Wavefront Representation by an Array of Gaussians.References. Periodic Signal Phase Detection and Algorithms Analysis: Least Squares Phase Detection of a Sinusoidal Signal. Quadrature Phase Detection of a Sinusoidal Signal. Discrete Low-Pass Filtering Functions. Fourier Description of Synchronous Phase Detection. Synchronous Detection Using a Few Sampling Points. Signal Amplitude Measurement. Characteristic Polynomial of a Sampling Algorithm. General Error Analysis of Synchronous Phase-Detection Algorithms. Some Sources of Phase Error. Shifting Algorithms with Respect to the Phase Origin. Optimization of Phase-Detection Algorithms. Influence of Window Function of Sampling Algorithms. Conclusions. Appendix: Derivative of the Amplitude of the Fourier Transform of the Reference Sampling Functions. References. Phase-Detection Algorithms: General Properties of Synchronous Phase-Detection Algorithms. Three-Step Algorithms To Measure the Phase. Four-Step Algorithms To Measure the Phase. Five-Step Algorithm. Algorithms with Symmetrical N +1 Phase Steps. Combined Algorithms in Quadrature. Detuning-Insensitive Algorithms for Distorted Signals. Algorithms Corrected for Nonlinear Phase-Shifting Error. Continuous Sampling in a Finite Interval. Asynchronous Phase-Detection Algorithms. Algorithm Summary. References. Phase-Shifting Interferometry: Phase-Shifting Basic Principles. An Introduction to Phase Shifting. Phase-Shifting Schemes and Phase Measurement. Heterodyne Interferometry. Phase-lock Detection. Sinusoidal Phase Oscillation Detection. Practical Source Technology Technology, CRC Press

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Interferogram Analysis for Optical Testing, Second Edition - Servin, Manuel Malacara, Daniel Malacara, Zacarias
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[ED: Hardcover], [PU: ST LUCIE PR], For those with deeper experience, it fills in the gaps and adds the information necessary to complete and update one's education. Written by the most experienced researchers in optical testing, this text discusses classical and innovative fringe analysis, principles of Fourier theory, digital image filtering, phase detection algorithms, and aspheric wavelength testing. It also explains how to assess wavefront deformation by calculating slope and local average curvature.Versandfertig in über 4 Wochen, [SC: 0.00]

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Interferogram Analysis For Optical Testing, Second Edition - Zacarias Malacara, Manuel Servin
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Zacarias Malacara, Manuel Servin, Hardcover - REV, Edition: 2,Series: Optical Engineering Series, English-language edition, Pub by Taylor & Francis Textbooks New, Books~~Technology~~Lasers & Photonics, Interferogram-Analysis-for-Optical-Testing-Second-Edition~~Daniel-Malacara, 999999999, Interferogram Analysis For Optical Testing, Second Edition, Zacarias Malacara, Manuel Servin, 1574446827, Taylor & Francis, , , , , Taylor & Francis

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Interferogram Analysis For Optical Testing 2nd Edition - Manuel Serv¡n Zacarias Malacara
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Interferogram Analysis For Optical Testing 2nd Edition Author :Manuel Serv¡n Zacarias Malacara 9781574446821 1574446827

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Interferogram Analysis for Optical Testing, Second Edition
Autor:

Servin, Manuel; Malacara, Daniel; Malacara, Zacarias

Titel:

Interferogram Analysis for Optical Testing, Second Edition

ISBN-Nummer:

9781574446821

The second edition of this comprehensive guide to optical testing interferometers outlines the fundamentals of the field and describes the computational methods for studying the fringe patterns produced by interferometry. The authors discuss classical and innovative fringe analysis techniques, the principles of Fourier theory, digital image enhancement and filtering, phase detection algorithms, and other important topics. The second edition updates these and other areas to reflect recent advances in such areas as the theory of phase shift algorithms, newly developed algorithms, and interferogram analysis without carrier. This is a valuable reference for both beginning and seasoned researchers.

Detailangaben zum Buch - Interferogram Analysis for Optical Testing, Second Edition


EAN (ISBN-13): 9781574446821
ISBN (ISBN-10): 1574446827
Gebundene Ausgabe
Erscheinungsjahr: 2005
Herausgeber: ST LUCIE PR
568 Seiten
Gewicht: 0,857 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 07.02.2007 15:02:58
Buch zuletzt gefunden am 15.12.2016 22:34:25
ISBN/EAN: 9781574446821

ISBN - alternative Schreibweisen:
1-57444-682-7, 978-1-57444-682-1

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