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Kleinster Preis: 104.50 EUR, größter Preis: 150.48 EUR, Mittelwert: 126.42 EUR
Advanced Test Methods for SRAMs - Arnaud Virazel#Serge Pravossoudovitch#Patrick Girard#Luigi Dilillo#Alberto Bosio
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
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Arnaud Virazel#Serge Pravossoudovitch#Patrick Girard#Luigi Dilillo#Alberto Bosio:

Advanced Test Methods for SRAMs - neues Buch

ISBN: 9781441909374

ID: 41b375445bb9bc7cf91c8a3e95fbc091

Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book. Bücher / Fremdsprachige Bücher / Englische Bücher 978-1-4419-0937-4, Springer

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Nr. 17593585 Versandkosten:Bei Bestellungen innerhalb der Schweiz berechnen wir Fr. 3.50 Portokosten, Bestellungen ab EUR Fr. 75.00 sind frei. Die voraussichtliche Versanddauer liegt bei 1 bis 2 Werktagen., Versandfertig innert 3 - 5 Werktagen, zzgl. Versandkosten
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Advanced Test Methods for SRAMs - Alberto Bosio#Luigi Dilillo#Patrick Girard#Serge Pravossoudovitch#Arnaud Virazel
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
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Alberto Bosio#Luigi Dilillo#Patrick Girard#Serge Pravossoudovitch#Arnaud Virazel:

Advanced Test Methods for SRAMs - neues Buch

ISBN: 9781441909374

ID: 41b375445bb9bc7cf91c8a3e95fbc091

Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book. Bücher / Fremdsprachige Bücher / Englische Bücher 978-1-4419-0937-4, Springer

Neues Buch Buch.ch
Nr. 17593585 Versandkosten:Bei Bestellungen innerhalb der Schweiz berechnen wir Fr. 3.50 Portokosten, Bestellungen ab EUR Fr. 75.00 sind frei. Die voraussichtliche Versanddauer liegt bei 1 bis 2 Werktagen., Versandfertig innert 3 - 5 Werktagen, zzgl. Versandkosten
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Advanced Test Methods for SRAMs - Arnaud Virazel#Serge Pravossoudovitch#Patrick Girard#Luigi Dilillo#Alberto Bosio
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Arnaud Virazel#Serge Pravossoudovitch#Patrick Girard#Luigi Dilillo#Alberto Bosio:
Advanced Test Methods for SRAMs - neues Buch

ISBN: 9781441909374

ID: 139638833

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called ´´static faults,´´ but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as ´´dynamic faults´´, are not covered by classical test solutions and require the dedicated test sequences presented in this book. Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

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(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Advanced Test Methods for SRAMs - Alberto Bosio#Luigi Dilillo#Patrick Girard#Serge Pravossoudovitch#Arnaud Virazel
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Alberto Bosio#Luigi Dilillo#Patrick Girard#Serge Pravossoudovitch#Arnaud Virazel:
Advanced Test Methods for SRAMs - neues Buch

ISBN: 9781441909374

ID: 138218055

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called ´´static faults,´´ but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as ´´dynamic faults´´, are not covered by classical test solutions and require the dedicated test sequences presented in this book. Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

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Test Methods for SRAMs - Luigi Dilillo
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Luigi Dilillo:
Test Methods for SRAMs - neues Buch

ISBN: 9781441909374

ID: 871640461

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called ''static faults,'' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as ''dynamic faults'', are not covered by classical test solutions and require the dedicated test sequences presented in this book. weltbild.at > Bücher > Wissenschaft & Technik > Fachbücher Technik, [PU: Springer]

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Autor:

Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud

Titel:

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

ISBN-Nummer:

9781441909374

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book. TOC:Introduction.-Basics on SRAM Memory Testing.-Resistive-Open Defects in Core-Cells.-Open Defects in Pre-Charge Circuits.-Resistive-Open Defects in Address Decoders.-Resistive-Open Defects in Write Drivers.-Resistive-Open Defects in Sense Amplifiers.-Faults due to Process Variations in SRAMs.-Diagnosis of Dynamic Faults.-Conclusion.

Detailangaben zum Buch - Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies


EAN (ISBN-13): 9781441909374
ISBN (ISBN-10): 1441909370
Gebundene Ausgabe
Erscheinungsjahr: 2009
Herausgeber: Springer-Verlag GmbH
171 Seiten
Gewicht: 0,431 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 16.07.2007 19:12:18
Buch zuletzt gefunden am 16.05.2016 16:21:24
ISBN/EAN: 9781441909374

ISBN - alternative Schreibweisen:
1-4419-0937-0, 978-1-4419-0937-4

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