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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard#Nicola Nicolici#Xiaoqing Wen
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Power-Aware Testing and Test Strategies for Low Power Devices - neues Buch

ISBN: 9781441909275

ID: 0c142962d61f694ee03eb0aa202ef0b3

Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions. Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits and systems is now considered as one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low-power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and Electronic Design Automation (EDA) solutions for testing low-power devices. The first comprehensive book on power-aware test for (low-power) circuits and systems Shows readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design-for-test and low-power design Covers in detail power-constrained test techniques, including power-aware automatic test pattern generation, design-for-test, built-in self-test and test compression Presents state-of-the-art industrial practices and EDA solutions Bücher / Fremdsprachige Bücher / Englische Bücher 978-1-4419-0927-5, Springer

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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard#Nicola Nicolici#Xiaoqing Wen
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Patrick Girard#Nicola Nicolici#Xiaoqing Wen:

Power-Aware Testing and Test Strategies for Low Power Devices - neues Buch

ISBN: 9781441909275

ID: 115530500

Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits and systems is now considered as one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low-power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and Electronic Design Automation (EDA) solutions for testing low-power devices. The first comprehensive book on power-aware test for (low-power) circuits and systems Shows readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design-for-test and low-power design Covers in detail power-constrained test techniques, including power-aware automatic test pattern generation, design-for-test, built-in self-test and test compression Presents state-of-the-art industrial practices and EDA solutions Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions. Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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Power-Aware Testing and Test Strategies for Low Power Devices - neues Buch

ISBN: 9781441909275

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices., [SC: 0.00]

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ISBN: 9781441909275

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Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions. weltbild.at > Bücher > Wissenschaft & Technik > Fachbücher Technik, [PU: Springer]

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Power-Aware Testing and Test Strategies for Low Power Devices - Girard, Patrick (Herausgeber); Nicolici, Nicola (Herausgeber); Wen, Xiaoqing (Herausgeber)
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2009, ISBN: 1441909273

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Power-Aware Testing and Test Strategies for Low Power Devices
Autor:

Patrick Girard

Titel:

Power-Aware Testing and Test Strategies for Low Power Devices

ISBN-Nummer:

9781441909275

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Detailangaben zum Buch - Power-Aware Testing and Test Strategies for Low Power Devices


EAN (ISBN-13): 9781441909275
ISBN (ISBN-10): 1441909273
Gebundene Ausgabe
Erscheinungsjahr: 2009
Herausgeber: Springer-Verlag GmbH
363 Seiten
Gewicht: 0,717 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 13.11.2009 20:04:16
Buch zuletzt gefunden am 16.05.2016 16:21:31
ISBN/EAN: 9781441909275

ISBN - alternative Schreibweisen:
1-4419-0927-3, 978-1-4419-0927-5

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