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Kleinster Preis: 134,75 €, größter Preis: 159,88 €, Mittelwert: 143,18 €
Yield and Variability Optimization of Integrated Circuits - Jian Cheng Zhang; Styblinski, M. A.
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Jian Cheng Zhang; Styblinski, M. A.:

Yield and Variability Optimization of Integrated Circuits - gebunden oder broschiert

2007, ISBN: 0792395514, Lieferbar binnen 4-6 Wochen Versandkosten:Versandkostenfrei innerhalb der BRD

ID: 9780792395515

Internationaler Buchtitel. In englischer Sprache. Verlag: Springer-Verlag GmbH, HC runder Rücken kaschiert, 256 Seiten, L=235mm, B=155mm, H=19mm, Gew.=555gr, [GR: 16850 - HC/Elektronik/Elektrotechnik/Nachrichtentechnik], [SW: - Elektrotechnik], Gebunden, Klappentext: Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modeling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. Yield and Variability Optimization of Integrated Circuits is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers. Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modeling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. Yield and Variability Optimization of Integrated Circuits is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers.

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Yield and Variability Optimization of Integrated Circuits - M.A. Jian Cheng Zhang, M.A. Styblinski
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Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modeling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. Yield and Variability Optimization of Integrated Circuits is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers. M.A. Jian Cheng Zhang, M.A. Styblinski, Books, Science and Nature, Yield and Variability Optimization of Integrated Circuits Books>Science and Nature, Springer US

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Yield and Variability Optimization of Integrated Circuits Author :Jian Cheng Zhang M.A. Styblinski 9780792395515 0792395514, [PU: Kluwer Academic Publishers]

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Yield and Variability Optimization of Integrated Circuits
Autor:

Jian Cheng Zhang; Styblinski, M. A.

Titel:

Yield and Variability Optimization of Integrated Circuits

ISBN-Nummer:

9780792395515

Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modeling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. Yield and Variability Optimization of Integrated Circuits is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers.

Detailangaben zum Buch - Yield and Variability Optimization of Integrated Circuits


EAN (ISBN-13): 9780792395515
ISBN (ISBN-10): 0792395514
Gebundene Ausgabe
Erscheinungsjahr: 2007
Herausgeber: Springer-Verlag GmbH
256 Seiten
Gewicht: 0,555 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 18.10.2007 12:12:37
Buch zuletzt gefunden am 10.08.2016 15:47:39
ISBN/EAN: 9780792395515

ISBN - alternative Schreibweisen:
0-7923-9551-4, 978-0-7923-9551-5

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