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Electrical Characterization of Silicon-on-Insulator Materials and Devices - Sorin Cristoloveanu, Sheng S. Li
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Electrical Characterization of Silicon-on-Insulator Materials and Devices - neues Buch

ISBN: 9780792395485

ID: 978079239548

Electrical Characterization of Silicon-on-Insulator Materials and Devices describes a wide variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. Each technique comes with pertinent technical information -- experimental set-up, basic models, parameter extraction -- that can be immediately useful to the reader. Electrical Characterization of Silicon-on-Insulator Materials and Devices provides a comprehensive and accessible treatment of all aspects of the latest SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues. Both the academic researchers and engineers working on the SOI technology will find this book invaluable as a source of pertinent scientific information, practical details, and references. For people planning to enter the SOI field, this book offers a unique coverage of the SOI technology and an attractive presentation of the underlying concepts. This book may also be used as a graduate level textbook for students who wish to learn more about the physics, applications, and electrical characterization of SOI devices. Sorin Cristoloveanu, Sheng S. Li, Books, Science and Nature, Electrical Characterization of Silicon-on-Insulator Materials and Devices Books>Science and Nature, Springer

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Engineering; Electrical Engineering; Optical and Electronic Materials Diode, electronics, material, microelectronics, transistor, Wafer Books Book, Springer Science+Business Media

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Electrical Characterization of Silicon-on-Insulator Materials and Devices Author :Sheng Li, Sorin Cristoloveanu 9780792395485 0792395484, [PU: Kluwer Academic Publishers]

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Electrical Characterization of Silicon-on-Insulator Materials and Devices Author :Sheng Li Sorin Cristoloveanu 9780792395485 0792395484, [PU: Kluwer Academic Publishers]

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NA Devices, Electrical, Springer

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Electrical Characterization of Silicon-on-Insulator Materials and Devices
Autor:

Cristoloveanu, Sorin; Li, Sheng S.; Li Sheng S.

Titel:

Electrical Characterization of Silicon-on-Insulator Materials and Devices

ISBN-Nummer:

9780792395485

Electrical Characterization of Silicon-on-Insulator Materials and Devices describes a wide variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. Each technique comes with pertinent technical information -- experimental set-up, basic models, parameter extraction -- that can be immediately useful to the reader. Electrical Characterization of Silicon-on-Insulator Materials and Devices provides a comprehensive and accessible treatment of all aspects of the latest SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues. Both the academic researchers and engineers working on the SOI technology will find this book invaluable as a source of pertinent scientific information, practical details, and references. For people planning to enter the SOI field, this book offers a unique coverage of the SOI technology and an attractive presentation of the underlying concepts. This book may also be used as a graduate level textbook for students who wish to learn more about the physics, applications, and electrical characterization of SOI devices.

Detailangaben zum Buch - Electrical Characterization of Silicon-on-Insulator Materials and Devices


EAN (ISBN-13): 9780792395485
ISBN (ISBN-10): 0792395484
Gebundene Ausgabe
Erscheinungsjahr: 1995
Herausgeber: Springer-Verlag GmbH
400 Seiten
Gewicht: 0,760 kg

Buch in der Datenbank seit 18.11.2007 04:22:02
Buch zuletzt gefunden am 17.12.2016 17:18:30
ISBN/EAN: 9780792395485

ISBN - alternative Schreibweisen:
0-7923-9548-4, 978-0-7923-9548-5

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