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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - Lucille A. Giannuzzi, Fred A. Stevie, North Carolina State University
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[SR: 2276436], Hardcover, [EAN: 9780387231167], Springer, Springer, Book, [PU: Springer], Springer, Focusing on techniques and applications, this text discusses and presents the theory related to applications and explores the applications and techniques used in FIBs and dual platform instruments., 922230, Industrial Chemistry, 278004, Chemistry, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278202, Industrial Chemistry, 278203, Ceramics & Glass, 278204, Detergents, 278205, Food & Beverage, 278207, Heavy Chemicals, 278208, Insecticide & Herbicide, 278209, Pharmaceutical Technology, 278210, Pigments, Dyestuffs & Paint, 278214, Powder, 278215, Rubber, 922268, Chemical, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278161, Applied Optics, 278162, Fibre Optics, 278164, Holography, 278165, Laser Technology, 278160, Electronics Engineering, 278141, Electronics & Communications Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278171, Other Electronic Devices, 278141, Electronics & Communications Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 922390, Engineering Physics, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278233, Materials Science, 278229, Mechanical & Materials Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278433, Light, Optics & Laser, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278434, Particle & High-Energy Physics, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278421, Spectrum Analysis, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278444, Condensed Matter, 278443, States of Matter, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 922952, Physics, 277889, Cosmology, 278439, Relativity, 922954, Superstings, 922868, Popular Science, 57, Science & Nature, 1025612, Subjects, 266239, Books, 564334, Scientific, Technical & Medical, 564336, Agriculture & Farming, 564338, Astronomy & Cosmology, 564340, Biology, 564342, Chemistry, 564344, Earth Sciences, 564346, Engineering, 570820, Environment, 564350, Geology, 564352, Mathematics, 564356, Medicine & Nursing, 564354, Physics, 564348, Research & Development, 564358, Veterinary Science, 1025612, Subjects, 266239, Books

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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - Lucille A. Giannuzzi, North Carolina State University
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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - gebunden oder broschiert

ISBN: 9780387231167

[SR: 1483260], Hardcover, [EAN: 9780387231167], Springer, Springer, Book, [PU: Springer], Springer, Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments., 227544, Electrical & Electronics, 3747, Networks, 173515, Engineering, 173507, Professional & Technical, 1000, Subjects, 283155, Books, 227550, Industrial, Manufacturing & Operational Systems, 173515, Engineering, 173507, Professional & Technical, 1000, Subjects, 283155, Books, 226704, Materials, 173515, Engineering, 173507, Professional & Technical, 1000, Subjects, 283155, Books, 13570, Chemistry, 16052551, Alkaloids, 13571, Analytic, 13511, Biochemistry, 16052341, Chemical Physics, 16052451, Chromatography, 13577, Crystallography, 13579, General & Reference, 226694, Geochemistry, 13590, Industrial & Technical, 13581, Inorganic, 16052621, Molecular Chemistry, 16052651, Nuclear Chemistry, 13585, Organic, 16052661, Photochemistry, 13588, Physical & Theoretical, 16052541, Polymers & Macromolecules, 16052401, Safety, 75, Science & Math, 1000, Subjects, 283155, Books, 226697, Electromagnetism, 16052201, Electricity, 16052241, Magnetism, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 16052321, Particle Physics, 14576, Nuclear Physics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14589, Optics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14585, Solid-State Physics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 491732, Physics, 468216, Science & Mathematics, 465600, New, Used & Rental Textbooks, 2349030011, Specialty Boutique, 283155, Books

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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. Books, Science and Geography~~Physics~~Particle & High-energy Physics, Introduction To Focused Ion Beams~~Book~~9780387231167, , , , , , , , , ,, [PU: Springer]

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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. Instrumentation, Theory, Techniques and Practice Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

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Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice - Giannuzzi, L. A. (Herausgeber); Stevie, F. A. (Herausgeber)
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2005, ISBN: 0387231161

ID: A3782039

Gebundene Ausgabe Materialwissenschaft, SCIENCE / Physics / General, TECHNOLOGY & ENGINEERING / Materials Science, TECHNOLOGY & ENGINEERING / Optics, mit Schutzumschlag neu, [PU:Springer-Verlag GmbH]

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Introduction to Focused Ion Beams
Autor:

L. A. Giannuzzi

Titel:

Introduction to Focused Ion Beams

ISBN-Nummer:

9780387231167

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. TOC:The Focused Ion Beam Instrument.- Ion-Solid Interactions.- Focused Ion Beam Gases for Deposition and Enhanced Etch.- Three-Dimensional Nanofabrication Using Focused Ion Beams.- Device Edits and Modifications.- The Uses of Dual Beam FIB in Microelectronic Failure Analysis.- High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy.- FIB for Materials Science Applications-a Review.- Practical Aspects of FIB TEM Specimen Preparation.- FIB Lift-Out Specimen Preparation Techniques.- A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method.- Dual-Beam (FIB-SEM) Systems.- Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS).- Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy.- Applications of FIB in Combination with Auger Electron Spectroscopy.- Appendices. Index.

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EAN (ISBN-13): 9780387231167
ISBN (ISBN-10): 0387231161
Gebundene Ausgabe
Erscheinungsjahr: 2005
Herausgeber: Springer-Verlag GmbH
358 Seiten
Gewicht: 0,744 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 05.04.2007 16:34:25
Buch zuletzt gefunden am 23.06.2016 10:25:27
ISBN/EAN: 9780387231167

ISBN - alternative Schreibweisen:
0-387-23116-1, 978-0-387-23116-7

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