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Kleinster Preis: 19.77 EUR, größter Preis: 152.88 EUR, Mittelwert: 96.33 EUR
Reliability and Failure of Electronic Materials and Devices - Milton Ohring
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Milton Ohring:

Reliability and Failure of Electronic Materials and Devices - gebunden oder broschiert

ISBN: 0125249853

[SR: 2099889], Hardcover, [EAN: 9780125249850], Academic Press, Academic Press, Book, [PU: Academic Press], Academic Press, Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. "Reliability and Failure of Electronic Materials and Devices" integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects - their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed. The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. It discusses reliability and failure on both the chip and packaging levels and handles the role of defects in yield and reliability. It includes a tutorial chapter on the mathematics of reliability and focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the mechanical failure of packages, contacts, and solder joints. It considers defect detection methods and failure analysis techniques., 269656, Architecture & Microprocessors, 269265, Computer Science, 71, Computing & Internet, 1025612, Subjects, 266239, Books, 269349, Systems Analysis & Design, 269265, Computer Science, 71, Computing & Internet, 1025612, Subjects, 266239, Books, 277106, Aviation, 277107, Commercial, 277109, History, 277076, Transport, 59, Reference, 1025612, Subjects, 266239, Books, 278272, Aerospace & Aviation Technology, 278267, Aeronautics & Aerospace, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 922354, Mechanics, 278122, Civil Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278150, Electrical, 278151, Electric Motors, 922290, Electrical Engineering, 278152, Electrician Skills, 922288, Electromagnetic Theory, 278153, Energy, 278299, Nanotechnology, 278157, Power Generation & Distribution, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278161, Applied Optics, 278160, Electronics Engineering, 278141, Electronics & Communications Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278169, Circuits, 278160, Electronics Engineering, 278141, Electronics & Communications Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278233, Materials Science, 278229, Mechanical & Materials Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 922314, Production, Manufacturing & Operational, 922402, Computer Aided Manufacture, 922322, Health & Safety, 278291, Industrial Design, 922320, Manufacturing, 922328, Materials & Industries, 922358, Productivity, 278168, Robotics, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278429, Electromagnetism, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278433, Light, Optics & Laser, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 571046, Electronics & Telecommunications Engineering, 564346, Engineering, 564334, Scientific, Technical & Medical, 1025612, Subjects, 266239, Books

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Reliability and Failure of Electronic Materials and Devices - Milton Ohring
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)

Milton Ohring:

Reliability and Failure of Electronic Materials and Devices - gebunden oder broschiert

ISBN: 0125249853

[SR: 2270402], Hardcover, [EAN: 9780125249850], Academic Press, Academic Press, Book, [PU: Academic Press], Academic Press, Suitable as a reference work for reliability professionals or as a text for advanced undergraduate o...., 269656, Architecture & Microprocessors, 269265, Computer Science, 71, Computing & Internet, 1025612, Subjects, 266239, Books, 269349, Systems Analysis & Design, 269265, Computer Science, 71, Computing & Internet, 1025612, Subjects, 266239, Books, 277106, Aviation, 277107, Commercial, 277109, History, 277076, Transport, 59, Reference, 1025612, Subjects, 266239, Books, 278272, Aerospace & Aviation Technology, 278267, Aeronautics & Aerospace, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 922354, Mechanics, 278122, Civil Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278150, Electrical, 278151, Electric Motors, 922290, Electrical Engineering, 278152, Electrician Skills, 922288, Electromagnetic Theory, 278153, Energy, 278299, Nanotechnology, 278157, Power Generation & Distribution, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278161, Applied Optics, 278160, Electronics Engineering, 278141, Electronics & Communications Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278169, Circuits, 278160, Electronics Engineering, 278141, Electronics & Communications Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278233, Materials Science, 278229, Mechanical & Materials Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 922314, Production, Manufacturing & Operational, 922402, Computer Aided Manufacture, 922322, Health & Safety, 278291, Industrial Design, 922320, Manufacturing, 922328, Materials & Industries, 922358, Productivity, 278168, Robotics, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278429, Electromagnetism, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278433, Light, Optics & Laser, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 571046, Electronics & Telecommunications Engineering, 564346, Engineering, 564334, Scientific, Technical & Medical, 1025612, Subjects, 266239, Books

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Reliability and Failure of Electronic Materials and Devices - Milton Ohring
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ISBN: 0125249853

ID: 6767761

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. Key Features* Discusses reliability and failure on both the chip and packaging levels* Handles the role of defects in yield and reliability* Includes a tutorial chapter on the mathematics of reliability* Focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the aerospace,biological sciences,biology,chemical,computer science,computers and technology,design and architecture,electrical and electronics,engineering,industrial engineering Physics, Academic Press

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ISBN: 9780125249850

ID: 9780125249850

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. Life Sciences Media > Printbook > Life Sciences Biological Sciences Printbook, Academic Press

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Reliability and Failure of Electronic Materials and Devices - Milton Ohring
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Milton Ohring:
Reliability and Failure of Electronic Materials and Devices - gebunden oder broschiert

ISBN: 9780125249850

Hardback, [PU: Elsevier Science Publishing Co Inc], Suitable as a reference work for reliability professionals or as a text for graduate students, this book introduces reliability literature of microelectronic and electronic-optional devices. It integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation., Circuits & Components

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Reliability and Failure of Electronic Materials and Devices
Autor:

Ohring, Milton

Titel:

Reliability and Failure of Electronic Materials and Devices

ISBN-Nummer:

9780125249850

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.<BR>The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. <BR>Key Features<BR>* Discusses reliability and failure on both the chip and packaging levels<BR>* Handles the role of defects in yield and reliability<BR>* Includes a tutorial chapter on the mathematics of reliability<BR>* Focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the mechanical failure of packages, contacts, and solder joints<BR>* Considers defect detection methods and failure analysis techniques

Detailangaben zum Buch - Reliability and Failure of Electronic Materials and Devices


EAN (ISBN-13): 9780125249850
ISBN (ISBN-10): 0125249853
Gebundene Ausgabe
Erscheinungsjahr: 1998
Herausgeber: ACADEMIC PR INC
692 Seiten
Gewicht: 1,102 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 13.08.2007 04:47:35
Buch zuletzt gefunden am 25.11.2016 04:20:59
ISBN/EAN: 9780125249850

ISBN - alternative Schreibweisen:
0-12-524985-3, 978-0-12-524985-0

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