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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz
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Brent Fultz:

Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

ISBN: 9783642297618

ID: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. Transmission Electron Microscopy and Diffractometry of Materials: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. Characterization of Materials Dark-Field and Bright-Field Imaging Diffraction and Imaging Diffraction from Crystals Imaging Lens Systems Neutron Scattering Small-Angle Scattering Theory of Electron Microscopy and X-Ray Diffraction Transmission Ele, Springer Berlin

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz
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Brent Fultz:

Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

ISBN: 9783642297618

ID: 9783642297618

This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis. Transmission Electron Microscopy and Diffractometry of Materials: This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis. Characterization of Materials Dark-Field and Bright-Field Imaging Diffraction and Imaging Diffraction from Crystals Imaging Lens Systems Neutron Scattering Small-Angle Scattering Theory of Electron Microscopy and X-Ray Diffraction Transmission Ele, Springer Berlin

Neues Buch Rheinberg-Buch.de
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Transmission Electron Microscopy and Diffractometry of Materials - Fultz, Brent; Howe, James
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Fultz, Brent; Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

2012

ISBN: 3642297617

ID: 9783642297618

In englischer Sprache. Verlag: Springer Berlin, Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials. James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials. PC-PDF, 761 Seiten, XX Seiten, 761 Seiten, 4., th ed. 2013, [GR: 9642 - Nonbooks, PBS / Physik, Astronomie/Mechanik, Akustik], [SW: - Klassische Mechanik ], [Ausgabe: 4], [PU: Springer, Berlin/Heidelberg/New York, NY]

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James M. Howe
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Brent Fultz; James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

2013, ISBN: 9783642297618

ID: 25431058

[ED: 4], 4., th ed. 2013, eBook Download (PDF), eBooks, [PU: Springer Berlin]

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James M. Howe
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Brent Fultz; James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - neues Buch

2013, ISBN: 9783642297618

ID: 25431058

[ED: 4], 4th ed. 2013, eBook Download (PDF), eBooks, [PU: Springer Berlin]

Neues Buch Lehmanns.de
Versandkosten:Download sofort lieferbar, , Sin costos de envío dentro de Alemania (EUR 0.00)
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Details zum Buch
Transmission Electron Microscopy and Diffractometry of Materials
Autor:

Brent Fultz;James Howe

Titel:

Transmission Electron Microscopy and Diffractometry of Materials

ISBN-Nummer:

3642297617

Detailangaben zum Buch - Transmission Electron Microscopy and Diffractometry of Materials


EAN (ISBN-13): 9783642297618
ISBN (ISBN-10): 3642297617
Erscheinungsjahr: 2012
Herausgeber: Springer Berlin
761 Seiten
Sprache: eng/Englisch

Buch in der Datenbank seit 07.11.2012 08:35:01
Buch zuletzt gefunden am 20.09.2016 01:12:58
ISBN/EAN: 3642297617

ISBN - alternative Schreibweisen:
3-642-29761-7, 978-3-642-29761-8

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