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Kleinster Preis: 100.87 EUR, größter Preis: 156.89 EUR, Mittelwert: 133.92 EUR
Optical Methods of Measurement - Sirohi, Rajpal
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ISBN: 9781574446975

ID: 1447111

Waves and Beams The Wave Equation Plane Waves Spherical Waves Cylindrical Waves Waves as Information Carriers The Laser Beam The Gaussian Beam ABCD Matrix Applied to Gaussian Beams Nondiffracting BeamsBessel Beams Singular Beams Optical Interference Introduction Generation of Coherent Waves Interference between Two Plane Monochromatic Waves Multiple-Beam Interference Interferometry Diffraction Fresnel Diffraction Fraunhofer Diffraction Action of a Lens Image Formation and Fourier Transformation by a Lens Optical Filtering Optical Components in Optical Metrology Resolving Power of Optical Systems Phase-Evaluation Methods Interference Equation Fringe Skeletonization Temporal Heterodyning Phase-Sampling Evaluation: Quasi-Heterodyning Phase-Shifting Method Phase-Shifting with Unknown but Constant Phase-Step Spatial Phase-Shifting Methods of Phase-Shifting Fourier Transform Method Spatial Heterodyning Detectors and Recording Materials Detector Characteristics Detectors Image Detectors Recording Materials Holographic Interferometry Introduction Hologram Recording Reconstruction Choice of Angle of Reference Wave Choice of Reference Wave Intensity Types of Holograms Diffraction Efficiency Experimental Arrangement Holographic Recording Materials Holographic Interferometry (HI) Fringe Formation and Measurement of Displacement Vector Loading of the Object Measurement of Very Small Vibration Amplitudes Measurement of Large Vibration Amplitudes Stroboscopic Illumination/Stroboscopic HI Special Techniques in HI Extending the Sensitivity of HI Holographic Contouring/Shape Measurement Holographic Photo-Elasticity Digital Holography Digital HI Speckle Metrology The Speckle Phenomenon Average Speckle Size Superposition of Speckle Patterns Speckle Pattern and Object Surface Characteristics Speckle Pattern and Surface Motion Speckle Photography Methods of Evaluation Speckle Photography with Vibrating Objects: In-Plane Vibration Sensitivity of Speckle Photography Particle Image Velocimetry White-Light Speckle Photography Shear Speckle Photography Speckle Interferometry Correlation Coefficient in Speckle Interferometry Out-of-Plane Speckle Interferometer In-Plane Measurement: Duffy's Method Filtering Arrangements for Extracting Information from Specklegram Out-of-Plane Displacement Measurement Simultaneous Measurement of Out-of-Plane and In-Plane Displacement Components Other Possibilities for Aperturing the Lens Duffy's Arrangement: Enhanced Sensitivity Speckle InterferometryShape Measurement/Contouring Speckle Shear Interferometry Methods of Shearing Theory of Speckle Shear Interferometry Fringe Formation Shear Interferometry without Influence of the In-Plane Component Electronic Speckle Pa Technology Technology eBook, CRC Press

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Optical Methods of Measurement: Wholefield Techniques, Second Edition - Rajpal Sirohi, Sirohi S. Sirohi
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Rajpal Sirohi, Sirohi S. Sirohi:

Optical Methods of Measurement: Wholefield Techniques, Second Edition - gebrauchtes Buch

ISBN: 9781574446975

ID: 9781574446975

Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems. Textbooks New, Books~~Technology~~Lasers & Photonics, Optical-Methods-of-Measurement~~Rajpal-S-Sirohi, 1543526, Optical Methods of Measurement: Wholefield Techniques, Second Edition, Rajpal Sirohi, Sirohi S. Sirohi, 1574446975, Taylor & Francis, , , , , Taylor & Francis

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Optical Methods of Measurement: Wholefield Techniques (Hardcover) - Rajpal S. Sirohi
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2009

ISBN: 1574446975

ID: 7697010421

[EAN: 9781574446975], Neubuch, Technology|Lasers, Hardcover. Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applicat.Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. 290 pages. 0.590

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Optical Methods of Measurement. CRC Press. 2009. - SIROHI, RAJPAL.
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SIROHI, RAJPAL.:
Optical Methods of Measurement. CRC Press. 2009. - gebunden oder broschiert

2009, ISBN: 1574446975

ID: 10402220087

[EAN: 9781574446975], Near Fine, [PU: CRC Press], Hardback, 316pp., This listing is a new book, a title currently in-print which we order directly and immediately from the publisher.

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Optical Methods of Measurement: Wholefield Techniques, Second Edition (Optical Science and Engineering) - Rajpal S. Sirohi
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Optical Methods of Measurement: Wholefield Techniques, Second Edition (Optical Science and Engineering) - gebunden oder broschiert

ISBN: 1574446975

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[EAN: 9781574446975], Neubuch, [PU: CRC Press]

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Optical Methods of Measurement: Wholefield Techniques, Second Edition
Autor:

Sirohi, R. S.; Sirohi, Rajpal S.

Titel:

Optical Methods of Measurement: Wholefield Techniques, Second Edition

ISBN-Nummer:

1574446975

A comprehensive collection of wholefield optical measurement techniques for engineering applications is provided in this book. The book covers both theory and practice and supplies a solid understanding of these technologies.

Detailangaben zum Buch - Optical Methods of Measurement: Wholefield Techniques, Second Edition


EAN (ISBN-13): 9781574446975
ISBN (ISBN-10): 1574446975
Gebundene Ausgabe
Erscheinungsjahr: 2009
Herausgeber: CRC PR INC
290 Seiten
Gewicht: 0,590 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 17.05.2008 22:04:40
Buch zuletzt gefunden am 04.04.2016 12:16:24
ISBN/EAN: 1574446975

ISBN - alternative Schreibweisen:
1-57444-697-5, 978-1-57444-697-5

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