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Sample Preparation Handbook for Transmission Electron Microscopy - Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Gabrielle Ehret; Danièle Laub
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Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Gabrielle Ehret; Danièle Laub:

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ISBN: 9781441960870

This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. The first volume covers general theoretical and practical aspects of the … Mehr…

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Sample Preparation Handbook for Transmission Electron Microscopy
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Sample Preparation Handbook for Transmission Electron Microscopy - neues Buch

ISBN: 9781441960870

This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. The first volume covers general theoretical and practical aspects of the … Mehr…

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Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Gabrielle Ehret; Danièle Laub:
Sample Preparation Handbook for Transmission Electron Microscopy - neues Buch

2010

ISBN: 9781441960870

Buch, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2010

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Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Gabrielle Ehret; Daniele Laub:
Sample Preparation Handbook for Transmission Electron Microscopy - neues Buch

2010, ISBN: 9781441960870

Buch, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2010

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Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub:
Sample Preparation Handbook for Transmission Electron Microscopy - gebunden oder broschiert

2010, ISBN: 9781441960870

Springer, 2010-07-09. 2010. Hardcover. Used:Good., Springer, 2010-07-09, 0

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Details zum Buch
Sample Preparation Handbook for Transmission Electron Microscopy

This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. The first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology. The second volume, Sample Preparation Handbook for Transmission Electron Microscopy: Techniques, describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors' years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy *http://temsamprep.in2p3.fr/

Detailangaben zum Buch - Sample Preparation Handbook for Transmission Electron Microscopy


EAN (ISBN-13): 9781441960870
ISBN (ISBN-10): 1441960872
Gebundene Ausgabe
Taschenbuch
Erscheinungsjahr: 2010
Herausgeber: Springer-Verlag New York Inc.
670 Seiten
Gewicht: 1,245 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 2009-02-02T07:52:21+01:00 (Berlin)
Detailseite zuletzt geändert am 2023-09-28T04:08:31+02:00 (Berlin)
ISBN/EAN: 1441960872

ISBN - alternative Schreibweisen:
1-4419-6087-2, 978-1-4419-6087-0
Alternative Schreibweisen und verwandte Suchbegriffe:
Autor des Buches: ayache, ehret, luc, jacqueline, ayach, gabrielle, beaunier, gabriel laub
Titel des Buches: transmission, electron microscopy, handbook sample preparation


Daten vom Verlag:

Autor/in: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Gabrielle Ehret; Danièle Laub
Titel: Sample Preparation Handbook for Transmission Electron Microscopy
Verlag: Springer; Springer US
670 Seiten
Erscheinungsjahr: 2010-07-09
New York; NY; US
Sprache: Englisch
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
Available
670 p. 2 volume-set.

BA; Characterization and Evaluation of Materials; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; Biological Microscopy; Biological Microscopy; Mineralogy; Nanotechnology; Characterization and Analytical Technique; Bioanalysis and Bioimaging; Mineralogy; Nanotechnology; Biophysik; Petrologie (Gesteinskunde), Petrografie und Mineralogie; Nanotechnologie

Introduction to materials.- The different observation modes in electron microscopy (SEM, TEM, STEM).- Materials problems and approaches for TEM and TEM/STEM analyses.- Physical and chemical mechanisms of preparation techniques.- Artifacts in transmission electron microscopy.- Selection of preparation techniques based on materials problems and TEM analyses.- Comparisons between techniques.-

Introduction.- Preliminary preparation techniques.- Thinning preparation techniques.- Mechanical preparation techniques.- Replica techniques.- Techniques specific to fine particles.- Contrast-enhancement and labeling techniques.-

First book on TEM sample preparation to combine all the most current techniques for applications ranging from minerals to biological materials

Compares techniques in terms of their limitations, artefacts, application areas, and types of analysis (macroscopic, atomic, or molecular level)

Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis

Complementary interactive database website is available to scientists worldwide



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9781489986979 Sample Preparation Handbook for Transmission Electron Microscopy (Collectif)


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