. .
Deutsch
Deutschland
Ähnliche Bücher
Weitere, andere Bücher, die diesem Buch sehr ähnlich sein könnten:
Suchtools
Anmelden

Anmelden mit Facebook:

Registrieren
Passwort vergessen?


Such-Historie
Merkliste
Links zu eurobuch.com

Dieses Buch teilen auf…
..?
Buchtipps
Aktuelles
Tipp von eurobuch.com
FILTER
- 0 Ergebnisse
Kleinster Preis: 149.48 EUR, größter Preis: 234.33 EUR, Mittelwert: 185.42 EUR
Introduction to Advanced System-on-Chip Test Design and Optimization: "problems, Modelling, Design And - Erik Larsson
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Erik Larsson:

Introduction to Advanced System-on-Chip Test Design and Optimization: "problems, Modelling, Design And - neues Buch

ISBN: 9781402032073

ID: 978140203207

Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at a high clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the increasing transistor count results in a higher number of possible fault sites. Testing must handle all these new challenges in an efficient manner having a global system perspective.Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and responses) generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (IEEE std 1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution.SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. Erik Larsson, Books, Science and Nature, Introduction to Advanced System-on-Chip Test Design and Optimization: "problems, Modelling, Design And Books>Science and Nature, Springer US

Neues Buch Indigo.ca
new Free shipping on orders above $25 Versandkosten:zzgl. Versandkosten
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Introduction To Advanced System-On-Chip Test Design And Optimization
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Introduction To Advanced System-On-Chip Test Design And Optimization - neues Buch

ISBN: 9781402032073

ID: 15439415

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test. SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. Books, Technology, Engineering and Agriculture~~Electronicsl and Communications Engineering~~Electronics Engineering, Introduction To Advanced System-On-Chip Test Design And Optimization~~Book~~9781402032073, , , , , , , , , ,, [PU: Springer]

Neues Buch Hive.co.uk
MPN: , SKU 15439415 Versandkosten:zzgl. Versandkosten
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Introduction to Advanced System-on-Chip Test Design and Optimization - Larsson, Erik
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Larsson, Erik:
Introduction to Advanced System-on-Chip Test Design and Optimization - neues Buch

ISBN: 9781402032073

ID: 303205

System-on-Chip (SOC) test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. There are three parts of the book - test concepts, SOC design for test, and SOC test applications. The first part is an introduction to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan, while the second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. The third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with core selection process. Technology Technology eBook, Springer

Neues Buch Ebooks.com
Versandkosten:zzgl. Versandkosten
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Introduction to Advanced System-on-Chip Test Design and Optimization - Erik Larsson
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Erik Larsson:
Introduction to Advanced System-on-Chip Test Design and Optimization - neues Buch

ISBN: 9781402032073

ID: 9781402032073

Engineering; Circuits and Systems; Electrical Engineering; Electronics and Microelectronics, Instrumentation; Engineering Design; Optical and Electronic Materials Boundary Scan, SOC test design, System-on-Chip, Transistor, automation, consumption, integrated circuit Books Book, Springer Science+Business Media

Neues Buch Springer.com
Versandkosten: EUR 0.00
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.
Introduction to Advanced System-on-Chip Test Design and Optimization 1st Edition - Erik Larsson
Vergriffenes Buch, derzeit bei uns nicht verfügbar.
(*)
Erik Larsson:
Introduction to Advanced System-on-Chip Test Design and Optimization 1st Edition - neues Buch

ISBN: 9781402032073

ID: 9781402032073

Introduction to Advanced System-on-Chip Test Design and Optimization 1st Edition Author :Erik Larsson 9781402032073 1402032072, [PU: Springer]

Neues Buch printsasia.de
new Versandkosten: EUR 0.00
Details...
(*) Derzeit vergriffen bedeutet, dass dieser Titel momentan auf keiner der angeschlossenen Plattform verfügbar ist.

< zum Suchergebnis...
Details zum Buch
Introduction to Advanced System-On-Chip Test Design and Optimization
Autor:

Larsson, Erik

Titel:

Introduction to Advanced System-On-Chip Test Design and Optimization

ISBN-Nummer:

1402032072

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. TOC:Part I. Testing Concepts. Introduction. Design Flow. Design for Test. Boundary Scan.- Part II. SoC Design for Testability. System Modeling. Test Conflicts. Test Power Dissipation. Test Access Mechanism. Test Scheduling.- Part III. SoC Test Applications. A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling. An Integrated Framework for the Design and Optimization of SoC Test Solutions. Efficient Test Solutions for Core-Based Designs. Integrating Core Selection in the System-On-Chip Test Solution Design-Flow. Defect-Aware Test Scheduling. An Integrated Technique for Test Vector Selection and Test Scheduling Under Ate Memory Depth Constraint.- Appendix 1. Benchmarks.- References.- Index.

Detailangaben zum Buch - Introduction to Advanced System-On-Chip Test Design and Optimization


EAN (ISBN-13): 9781402032073
ISBN (ISBN-10): 1402032072
Gebundene Ausgabe
Erscheinungsjahr: 2005
Herausgeber: SPRINGER VERLAG GMBH
388 Seiten
Gewicht: 1,093 kg
Sprache: eng/Englisch

Buch in der Datenbank seit 11.07.2007 13:25:27
Buch zuletzt gefunden am 28.11.2016 11:33:35
ISBN/EAN: 1402032072

ISBN - alternative Schreibweisen:
1-4020-3207-2, 978-1-4020-3207-3

< zum Suchergebnis...
< zum Archiv...
Benachbarte Bücher